A sub-micrometer resolution hard X-ray microprobe system of BL8C at Pohang Light Source.

A microprobe system has been installed on the nanoprobe/XAFS beamline (BL8C) at PLS-II, South Korea. Owing to the reproducible switch of the gap of the in-vacuum undulator (IVU), the intense and brilliant hard X-ray beam of an IVU can be used in X-ray fluorescence (XRF) and X-ray absorption fine-structure (XAFS) experiments. For high-spatial-resolution microprobe experiments a Kirkpatrick-Baez mirror system has been used to focus the millimeter-sized X-ray beam to a micrometer-sized beam.

Characteristics of a tapered undulator for the X-ray absorption fine-structure technique at PLS-II.

An in-vacuum undulator (IVU) with a tapered configuration was installed in the 8C nanoprobe/XAFS beamlime (BL8C) of the Pohang Light Source in Korea for hard X-ray nanoprobe and X-ray absorption fine-structure (XAFS) experiments. It has been operated in planar mode for the nanoprobe experiments, while gap-scan and tapered modes have been used alternatively for XAFS experiments. To examine the features of the BL8C IVU for XAFS experiments, spectral distributions were obtained theoretically and experimentally as functions of the gap and gap taper.