Effect of dielectric roughness on performance of pentacene TFTs and restoration of performance with a polymeric smoothing layer.

The morphology, structure, and transport properties of pentacene thin film transistors (TFTs) are reported showing the influence of the gate dielectric surface roughness. Upon roughening of the amorphous SiO2 gate dielectric prior to pentacene deposition, dramatic reductions in pentacene grain size and crystallinity were observed. The TFT performance of pentacene films deposited on roughened substrates showed reduced free carrier mobility, larger transport activation energies, and larger trap distribution widths.

p-Channel organic semiconductors based on hybrid acene-thiophene molecules for thin-film transistor applications.

We report the structural and electrical characterization of two new p-channel organic semiconductors, 5,5'-bis(2-tetracenyl)-2,2'-bithiophene (1) and 5,5'-bis(2-anthracenyl)-2,2'-bithiophene (2). Both compounds exhibited a high degree of thermal stability with decomposition temperatures of 530 degrees C and 425 degrees C for 1 and 2, respectively. The thin-film structures of 1 and 2 were examined using wide-angle X-ray diffraction (XRD), grazing incidence X-ray diffraction (GIXD), and atomic force microscopy (AFM).

Structural characterization of a pentacene monolayer on an amorphous SiO2 substrate with grazing incidence x-ray diffraction.

Grazing incidence X-ray diffraction reveals that a pentacene monolayer, grown on an amorphous SiO2 substrate that is commonly used as a dielectric layer in organic thin film transistors (OTFTs), is crystalline. A preliminary energy-minimized model of the monolayer, based on the GIXD data, reveals that the pentacene molecules adopt a herringbone arrangement with their long axes tilted slightly from the substrate normal. Although this arrangement resembles the general packing features of the (001) layer in single crystals of bulk pentacene, the monolayer lattice parameters and crystal structure differ from those of the bulk.