Extent of dependence of crystalline, morphological, optical and electrical properties on deposition time of sprayed SnS thin films.

In the present experimental work, Tin Sulphide (SnS) thin films with various thicknesses have been grown on nonconducting substrate by using chemical spray pyrolysis technique in order to study the extent of dependence of crystallite size, morphological and optical properties of SnS films on their deposition times. The obtained films were characterized using x-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), UV-visible and Hall Effect measurements. From 15 min to 60 min with an increase of 15 min each time one of all films was deposited, the XRD analysis indicated that all four sprayed SnS films are mainly composed with orthorhombic SnS phase, having a growing dominant peak intensity (120), with increasing deposition time.

Microtexture analysis of copper-doped iron oxide thin films prepared by air pneumatic spray.

The stereometric and fractal concepts are crucial tools to analyse, to verify, to report 3-D microtexture of thin film surfaces on the nanometre scale and thereby to generate useful topographic characteristics for better understanding and steering them toward further improvements and rational use in modern applications. At first, the present work aimed to prepare hematite α-Fe O thin films with (0, 2, 4, 6 and 8 wt%) of Cu doping by using the air pneumatic spray method. Subsequently, the obtained pure α-Fe O and Cu-doped α-Fe O thin films were characterised by XRD device, which determines their polycrystalline nature with the rhombohedral hematite structure.

Multifractal analysis of Mg-doped ZnO thin films deposited by sol-gel spin coating method.

A multifractal analysis has been performed on the 3D (three-dimensional) surface microtexture of magnesium-doped zinc oxide (ZnO:Mg) thin films with doping concentration of 0, 2, 4, and 5%. Thin films were deposited onto the glass substrates via the sol-gel spin coating method. The effect of magnesium doping, on the crystal structure, morphology, and band gap for ZnO:Mg thin films has been analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and UV-Vis spectroscopy.