Electric field-induced crossover from 3D to 2D topological defects in a nematic liquid crystal: experimental verification.

A substrate was patterned with two pairs of half-integer strength topological defects, (+1/2, +1/2) and (+1/2, -1/2). In a sufficiently thick cell, a disclination line runs in an arch above the substrate connecting the two half integer defects within each pair. The director around the disclination line for the like-sign pair must rotate in 3D, whereas for the opposite-sign defect pair the director lies in the xy-plane parallel to the substrate.

Theory of helicoids and skyrmions in confined cholesteric liquid crystals.

Cholesteric liquid crystals experience geometric frustration when they are confined between surfaces with anchoring conditions that are incompatible with the cholesteric twist. Because of this frustration, they develop complex topological defect structures, which may be helicoids or skyrmions. We develop a theory for these structures, which extends previous theoretical research by deriving exact solutions for helicoids with the assumption of constant azimuth, calculating numerical solutions for helicoids and skyrmions with varying azimuth, and interpreting the results in terms of competition between terms in the free energy.

Correction: Cholesteric liquid crystals in rectangular microchannels: skyrmions and stripes.

Correction for 'Cholesteric liquid crystals in rectangular microchannels: skyrmions and stripes' by Yubing Guo et al., Soft Matter, 2016, DOI: 10.1039/c6sm01190j.

Cholesteric liquid crystals in rectangular microchannels: skyrmions and stripes.

In this paper, we present experimental and numerical studies on the microstructures of a cholesteric liquid crystal (CLC) confined in rectangular micron-channels. By using a sequence of microfabrication techniques we fabricated the micro-sized channels with accurately controlled size, aspect ratio and homeotropic surface anchoring. Through optical microscopic studies we established a phase diagram for the liquid crystal defect textures as a function of the channel depth and width.