Robust Energy Calibration Technique for Photon Counting Spectral Detectors.

This paper describes the implementation of a novel and robust threshold energy calibration method for photon counting detectors using polychromatic X-ray tubes. Methods often used for such energy calibration may require re-orientation of the detector or introduce calibration errors that are flux and acquisition time-dependent. Our newly proposed "differential intensity ratios" (DIR) method offers a practical and robust alternative to existing methods.

DNA Origami Structures Interfaced to Inorganic Nanodevices.

We describe here one way to achieve hybrid DNA-inorganic nanostructures on rigid flat insulating substrates. We report methods to prepare rectangular DNA origami and incubate them onto arrays of anchoring gold nanodots either in a static solution or in a microfluidic system. We give details on the design and lithographic methods employed to pattern usable arrays of gold nanoanchors on naturally oxidized silicon wafer chips.

Practical application of direct electron detectors to EBSD mapping in 2D and 3D.

The use of a direct electron detector for the simple acquisition of 2D electron backscatter diffraction (EBSD) maps and 3D EBSD datasets with a static sample geometry has been demonstrated in a focused ion beam scanning electron microscope. The small size and flexible connection of the Medipix direct electron detector enabled the mounting of sample and detector on the same stage at the short working distance required for the FIB. Comparison of 3D EBSD datasets acquired by this means and with conventional phosphor based EBSD detectors requiring sample movement showed that the former method with a static sample gave improved slice registration.

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction.

Advanced structural characterisation techniques which are rapid to use, non-destructive and structurally definitive on the nanoscale are in demand, especially for a detailed understanding of extended-defects and their influence on the properties of materials. We have applied the electron backscatter diffraction (EBSD) technique in a scanning electron microscope to non-destructively characterise and quantify antiphase domains (APDs) in GaP thin films grown on different (001) Si substrates with different offcuts. We were able to image and quantify APDs by relating the asymmetrical intensity distributions observed in the EBSD patterns acquired experimentally and comparing the same with the dynamical electron diffraction simulations.

Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications.

We analyse the signal formation process for scanning electron microscopic imaging applications on crystalline specimens. In accordance with previous investigations, we find nontrivial effects of incident beam diffraction on the backscattered electron distribution in energy and momentum. Specifically, incident beam diffraction causes angular changes of the backscattered electron distribution which we identify as the dominant mechanism underlying pseudocolour orientation imaging using multiple, angle-resolving detectors.