Publications by authors named "S V Fallert"

Scaling behavior of the disordered contact process.

Phys Rev E Stat Nonlin Soft Matter Phys

April 2009

The one-dimensional contact process with weak to intermediate quenched disorder in its transmission rates is investigated via quasistationary Monte Carlo simulation. We address the contested questions of both the nature of dynamical scaling, conventional or activated, as well as of universality of critical exponents by employing a scaling analysis of the distribution of lifetimes and the quasistationary density of infection. We find activated scaling to be the appropriate description for intermediate to strong disorder.

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The critical behavior of the contact process (CP) in disordered and periodic binary two-dimensional (2D) lattices is investigated numerically by means of Monte Carlo simulations as well as via an analytical approximation and standard mean field theory. Phase-separation lines calculated numerically are found to agree well with analytical predictions around the homogeneous point. For the disordered case, values of static scaling exponents obtained via quasistationary simulations are found to change with disorder strength.

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Heart rate data collected during nonlaboratory conditions present several data-modeling challenges. First, the noise in such data is often poorly described by a simple Gaussian; it has outliers and errors come in bursts. Second, in large-scale studies the ECG waveform is usually not recorded in full, so one has to deal with missing information.

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The one-dimensional contact process (CP) in a heterogeneous environment-a binary chain consisting of two types of site with different recovery rates-is investigated. It is argued that the commonly used random-sequential Monte Carlo simulation method which employs a discrete notion of time is not faithful to the rates of the contact process in a heterogeneous environment. Therefore, a modification of this algorithm along with two alternative continuous-time implementations are analyzed.

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The critical behavior of the contact process (CP) in heterogeneous periodic and weakly disordered environments is investigated using the supercritical series expansion and Monte Carlo (MC) simulations. Phase-separation lines and critical exponents beta (from series expansion) and eta (from MC simulations) are calculated. A general analytical expression for the locus of critical points is suggested for the weak-disorder limit and confirmed by the series expansion analysis and the MC simulations.

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