Study of curtaining effect reduction methods in Inconel 718 using a plasma focused ion beam.

The curtaining effect is a common challenge in focused ion beam (FIB) surface preparation. This study investigates methods to reduce this effect during plasma FIB milling of Inconel 718 (nickel-based superalloy). Platinum deposition, silicon mask and XeF gas injection were explored as potential solutions.

On the mechanical and electronic properties of thiolated gold nanocrystals.

We present a quantitative exploration, combining experiment and simulation, of the mechanical and electronic properties, as well as the modifications induced by an alkylthiolated coating, at the single nanoparticle (NP) level. We determined the response of the NPs to external pressure in a controlled manner using an atomic force microscope tip. We found a strong reduction in their Young's modulus, as compared to bulk gold, and a significant influence of strain on the electronic properties of the alkylthiolated NPs.

Semi-metallic polymers.

Polymers are lightweight, flexible, solution-processable materials that are promising for low-cost printed electronics as well as for mass-produced and large-area applications. Previous studies demonstrated that they can possess insulating, semiconducting or metallic properties; here we report that polymers can also be semi-metallic. Semi-metals, exemplified by bismuth, graphite and telluride alloys, have no energy bandgap and a very low density of states at the Fermi level.

Etching processes of polytetrafluoroethylene surfaces exposed to He and He-O2 atmospheric post-discharges.

A comparative study of polytetrafluoroethylene (PTFE) surfaces treated by the post-discharge of He and He-O(2) plasmas at atmospheric pressure is presented. The characterization of treated PTFE surfaces and the species involved in the surface modification are related. In pure He plasmas, no significant change of the surface has been observed by X-ray photoelectron spectroscopy (XPS), dynamic water contact angles (dWCA) and atomic force microscopy (AFM), in spite of important mass losses recorded.

Nanoscale investigation of the electrical properties in semiconductor polymer-carbon nanotube hybrid materials.

The morphology and electrical properties of hybrids of a semiconducting polymer (namely poly(3-hexylthiophene) P3HT) and carbon nanotubes are investigated at the nanoscale with a combination of Scanning Probe Microscopy techniques, i.e., Conductive Atomic Force Microscopy (C-AFM) and time-resolved Current Sensing Force Spectroscopy Atomic Force Microscopy (CSFS-AFM, or PeakForce TUNA™).