[Quantitative surface analysis of Pt-Co, Cu-Au and Cu-Ag alloy films by XPS and AES].

In order to improve the quantitative analysis accuracy of AES, We associated XPS with AES and studied the method to reduce the error of AES quantitative analysis, selected Pt-Co, Cu-Au and Cu-Ag binary alloy thin-films as the samples, used XPS to correct AES quantitative analysis results by changing the auger sensitivity factors to make their quantitative analysis results more similar. Then we verified the accuracy of the quantitative analysis of AES when using the revised sensitivity factors by other samples with different composition ratio, and the results showed that the corrected relative sensitivity factors can reduce the error in quantitative analysis of AES to less than 10%. Peak defining is difficult in the form of the integral spectrum of AES analysis since choosing the starting point and ending point when determining the characteristic auger peak intensity area with great uncertainty, and to make analysis easier, we also processed data in the form of the differential spectrum, made quantitative analysis on the basis of peak to peak height instead of peak area, corrected the relative sensitivity factors, and verified the accuracy of quantitative analysis by the other samples with different composition ratio.

[Mineralogical effect correction for pressed iron ore samples in wavelength dispersive X-ray fluorescence analysis].

The possibility of correcting mineralogical effect for pressed powder pellets of iron ore samples was studied in wavelength dispersive X-ray fluorescence analysis of major and minor elements with 10 Chinese iron ore CRMs. Two methods were applied to reduce the influence of mineralogical effect. The first one is to check 20 angles for every sample before measurement to correct peak shift; another method is replacing peak intensity with peak area of the analytical line to correct the shape distortion of the spectrum.

[Calculation of the contributions of scattering effects to the X-ray fluorescence intensities].

The contribution of scattering effects to the X-ray fluorescence intensity was studied for pure element samples, BaB binary samples and fused disk samples by theoretic calculation and experiment. Three scattering effects were considered in the present study, i. e.

[Study on the influence of excitation voltage and anode on the contribution of scattering effects to the intensity of X-ray fluorescence].

The influence of X-ray tube spectral distribution related to the X-ray tube voltage and target anode on the contribution of scattering effects to the intensity of fluorescence was studied by using some fused disk samples. Three scattering effects were considered. They are coherent scattering effect, incoherent scattering effect and primary fluorescence scattered into the direction of detector respectively.