Record Low Thermal Conductivity of Polycrystalline MoS Films: Tuning the Thermal Conductivity by Grain Orientation.

We report a record low thermal conductivity in polycrystalline MoS obtained for ultrathin films with varying grain sizes and orientations. By optimizing the sulfurization parameters of nanometer-thick Mo layers, five MoS films containing a combination of horizontally and vertically oriented grains, with respect to the bulk (001) monocrystal, were grown. From transmission electron microscopy, the average grain size, typically below 10 nm, and proportion of differently oriented grains were extracted.

Comparison between diffraction contrast tomography and high-energy diffraction microscopy on a slightly deformed aluminium alloy.

The grain structure of an Al-0.3 wt%Mn alloy deformed to 1% strain was reconstructed using diffraction contrast tomography (DCT) and high-energy diffraction microscopy (HEDM). 14 equally spaced HEDM layers were acquired and their exact location within the DCT volume was determined using a generic algorithm minimizing a function of the local disorientations between the two data sets.