Publications by authors named "Romain Duverger"

The depth-of-field (DoF) of localization microscopes can be extended by placing a phase mask in the aperture stop of the objective. To optimize these masks and characterize their performance, defocus is in general modeled by a simple quadratic pupil phase term. However, this model does not take into account two essential characteristics of localization microscopy setups: an extremely high numerical aperture (NA) and a mismatch between the refractive indices of the immersion liquid and sample.

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