On-axis sample viewer with flexible working distance for an X-ray spectroscopy beamline.

Conducting research using micrometer-sized X-ray beams with small samples is common at modern synchrotron X-ray sources. Often, the relative alignment between the X-ray beam and sample is time consuming. An on-axis or coaxial camera system with a view of the sample in a direction along the path of the X-ray beam with its depth of field set to coincide with the location of the focal spot of the X-ray beam is preferred.

A multi-technique study of altered granitic rock from the Krunkelbach Valley uranium deposit, Southern Germany.

Herein, a multi-technique study was performed to reveal the elemental speciation and microphase composition in altered granitic rock collected from the Krunkelbach Valley uranium (U) deposit area near an abandoned U mine, Black Forest, Southern Germany. The former Krunkelbach U mine with 1-2 km surrounding area represents a unique natural analogue site with the rich accumulation of secondary U minerals suitable for radionuclide migration studies from a spent nuclear fuel (SNF) repository. Based on a micro-technique analysis using several synchrotron-based techniques such as X-ray fluorescence analysis, X-ray absorption spectroscopy, powder X-ray diffraction and laboratory-based scanning electron microscopy and Raman spectroscopy, the complex mineral assemblage was identified.

Position and flux stabilization of X-ray beams produced by double-crystal monochromators for EXAFS scans at the titanium K-edge.

The simultaneous and active feedback stabilization of X-ray beam position and monochromatic beam flux during EXAFS scans at the titanium K-edge as produced by a double-crystal monochromator beamline is reported. The feedback is generated using two independent feedback loops using separate beam flux and position measurements. The flux is stabilized using a fast extremum-searching algorithm that is insensitive to changes in the synchrotron ring current and energy-dependent monochromator output.

In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector.

Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region within the foil as illuminated by the incident beam. These images contain information about beam size, beam position and beam intensity that is extracted during dedicated signal processing steps.

In situ X-ray beam imaging using an off-axis magnifying coded aperture camera system.

An imaging model and an image reconstruction algorithm for a transparent X-ray beam imaging and position measuring instrument are presented. The instrument relies on a coded aperture camera to record magnified images of the footprint of the incident beam on a thin foil placed in the beam at an oblique angle. The imaging model represents the instrument as a linear system whose impulse response takes into account the image blur owing to the finite thickness of the foil, the shape and size of camera's aperture and detector's point-spread function.

High-resolution transparent x-ray beam location and imaging.

We present a high-resolution in situ imaging and localization method of energetic particle beams. Recording of the scattered radiation from a thin featureless foil, placed in the path of the beam, and taken with a pinhole or coded aperture camera arrangement magnifies beam movements at the sensor. At the same time, a magnified image of the beam is available with an exceptional signal-to-noise ratio.

A transparent two-dimensional in situ beam-position and profile monitor for synchrotron X-ray beamlines.

A compact, inexpensive and easy-to-construct two-dimensional in situ beam-position and profile monitor for synchrotron X-ray beamlines is presented. The device is based on the collection of spatially resolved scattered radiation from a polyimide foil. The X-ray beam passes through a foil placed in the path of the beam, which absorbs no more than 3% of the beam at 12 keV.