Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements.

A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance of the films as active layers of organic electronic devices. In this work, such combination of techniques was used to investigate the phase transitions in vacuum-deposited thin films of a common organic semiconductor dihexyl-quarterthiophene (DH4T).

One Methylene Group in the Side Chain Can Alter by 90 Degrees the Orientation of a Main-Chain Liquid Crystal on a Unidirectional Substrate.

The mechanisms of orientation of columnar liquid crystals (LCs) on a PTFE-rubbed surface are explored on a homologous series of symmetrically substituted poly(di--alkylsiloxanes) (PDAS). It is shown that by increasing the side-chain length in steps of one CH group, the orientation of PDAS switches back and forth from perpendicular to parallel with respect to PTFE chains. These changes are sensitive to the smallest possible variation of the macromolecular structure (i.

Impact of the solubility of organic semiconductors for solution-processable electronics on the structure formation: a real-time study of morphology and electrical properties.

The control of structure formation in the active layers of organic solar cells allows for improvement in their processability and enhancement of the efficiency of the final devices. In the present work, in situ studies of film formation from binary toluene solutions of an electron donor, poly(3-hexylthiophene) (P3HT), and an electron acceptor such as [6,6]-phenyl-C-61-butyric acid methyl ester (PCBM) or indene-C60 bisadduct (ICBA) have been conducted. These experiments were carried out using GIWAXS with simultaneous electric current measurements.