Publications by authors named "Richard Rizk"

Objective: The aim of the study is the analysis of osteoarticular problems (OAP) occurring in a group of computer users (CU) in search of correlation between symptoms and different etiological factors.

Material And Method: Questionnaire of 31 items dealing with personal data, the activity of the CU, stress, the occurrence of osteoarticular problems during the last month (Oaplm) and last twelve months (Oaptm) and a checklist of 17 items covering the physical characteristics of the workplace.

Results: DESCRIPTIVE ANALYSIS * 810 respondents of mean age 36 +/- 9 years and predominantly female (69%) *

Features: seniority at the workplace (12.

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Article Synopsis
  • Resistive switching in a metal-free silicon-based material presents a promising alternative to traditional metal oxide-based resistive RAM, offering advantages in fabrication and performance.
  • The study focuses on non-stoichiometric silicon-rich silicon dioxide films, showcasing multi-level and analog resistance modulation, along with standard two-level switching.
  • The devices demonstrate features like nonlinearity and self-rectification, enabling better integration in crossbar arrays while minimizing leakage currents, with further insights into conduction mechanisms provided by scanning tunneling microscopy.
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We present an analysis of factors influencing carrier transport and electroluminescence (EL) at 1.5 µm from erbium-doped silicon-rich silica (SiOx) layers. The effects of both the active layer thickness and the Si-excess content on the electrical excitation of erbium are studied.

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This study investigates the influence of the film thickness on the silicon-excess-mediated sensitization of Erbium ions in Si-rich silica. The Er3+ photoluminescence at 1.5 μm, normalized to the film thickness, was found five times larger for films 1 μm-thick than that from 50-nm-thick films intended for electrically driven devices.

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