Atomic-scale characterization of oxide thin films gated by ionic liquid.

Ionic liquids (ILs) have received considerable interest for use in electrostatic gating in complex oxide systems. Understanding the ionic liquid/oxide interface, and any bias-induced electrochemical degradation, is critical for the interpretation of transport phenomena. The integrity of the interface between ionic liquid 1-ethyl-3-methylimidazolium hexafluorophosphate and La1/3Sr2/3FeO3 under various biasing conditions was examined by analytical transmission electron microscopy, and we report film degradation in the form of an irreversible chemical reaction regardless of the applied bias.

Control of functional responses via reversible oxygen loss in La₁-xSrxFeO₃-δ films.

La0.3 Sr0.7 FeO3-δ films undergo dramatic changes in electronic and optical properties due to reversible oxygen loss induced by low-temperature heating.