IEEE Trans Ultrason Ferroelectr Freq Control
January 2015
Direct evidence of ferroelectric/ferroelastic domain reorientation is shown in Pb(Zr0.30Ti0.70)O3 (PZT30/70) thin films clamped to a rigid silicon substrate using in situ synchrotron X-ray diffraction during application of electric fields.
View Article and Find Full Text PDFIndian J Chest Dis Allied Sci
August 1994