Publications by authors named "Radislav Smid"

An important issue in ultrasonic nondestructive testing is the detection of flaw echoes in the presence of background noise created by instrumentation and by clutter noise. Signal averaging, autoregressive analysis, spectrum analysis, matched filtering, and the wavelet transform have all been used to filter noise in ultrasonic signals. Widely-used wavelet threshold estimation algorithms are not designed for electromagnetic acoustic transducer (EMAT) pulse-echo signals, and therefore do not exploit their unique impulse nature.

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In ultrasonic non-destructive testing of materials with a coarse-grained structure the scattering from the grains causes backscattering noise, which masks flaw echoes in the measured signal. Several filtering methods have been proposed for improving the signal-to-noise ratio. In this paper we present a comparative study of methods based on the wavelet transform.

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In the field of low flux optical measurements, the development and use of large area silicon detectors is becoming more frequent. The current/voltage conversion of their photocurrent presents a set of problems for traditional transimpedance amplifiers. The switched integration principle overcomes these limitations.

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