Quantitative determination of van Gogh's painting grounds using SEM/EDX.

We have investigated the potential of utilizing analytical electron microscopy to quantitatively examine the grounds used by van Gogh and, in particular, the absolute amount of extender employed. To determine the accuracy that can be achieved, a series of oil paint reconstructions were used as standards. The proportion of extender was measured using scanning electron microscopy and energy dispersive X-ray spectroscopy, and a relative error of 10% or better was achieved.

Influence of a TiCl4 post-treatment on nanocrystalline TiO2 films in dye-sensitized solar cells.

In this study, the influence of the TiCl(4) post-treatment on nanocrystalline TiO(2) films as electrodes in dye-sensitized solar cells is investigated and compared to nontreated films. As a result of this post-treatment cell efficiencies are improved, due to higher photocurrents. On a microscopic scale TiO(2) particle growth on the order of 1 nm is observed.

Preparation of site-specific cross-sections of heterogeneous catalysts prepared by focused ion beam milling.

Focused ion beam (FIB) milling offers a novel approach to preparation of site-specific cross-sections of heterogeneous catalysts for examination in the transmission electron microscope (TEM). Electron-transparent sections can be obtained without the need to embed or grind the original sample. Because the specimen can be imaged in the FIB with submicrometre resolution before, during and after milling it is possible to select precisely the region from which the section is removed and to control the thickness of the section to within tens of nanometres.