A New Haplotype in the Wheat Fungal Pathogen .

The necrotrophic effector ToxA is a well-studied virulence factor produced by several fungal necrotrophs. Initially cloned from the wheat tan spot pathogen in 1996, was found almost a decade later in another fungal pathogen, and its sister species, . In 2018, ToxA was detected in a third wheat fungal pathogenic species, , which causes spot blotch disease.

Specific Detection and Quantification of Major Fusarium spp. Associated with Cereal and Pulse Crops.

Plant pathogenic Fusarium spp. are widespread and cause important diseases on a wide host range, including economically important cereal and pulse crops. A number of molecular methods have been used to detect, identify, and quantify a long list of plant pathogenic Fusarium spp.

A Revised Nomenclature for Haplotypes Across Multiple Fungal Species.

ToxA is one of the most studied proteinaceous necrotrophic effectors produced by plant pathogens. It has been identified in four pathogens (, , [formerly f. sp.

Identification of Disease Resistance Parents and Genome-Wide Association Mapping of Resistance in Spring Wheat.

The likelihood of success in developing modern cultivars depend on multiple factors, including the identification of suitable parents to initiate new crosses, and characterizations of genomic regions associated with target traits. The objectives of the present study were to (a) determine the best economic weights of four major wheat diseases (leaf spot, common bunt, leaf rust, and stripe rust) and grain yield for multi-trait restrictive linear phenotypic selection index (RLPSI), (b) select the top 10% cultivars and lines (hereafter referred as genotypes) with better resistance to combinations of the four diseases and acceptable grain yield as potential parents, and (c) map genomic regions associated with resistance to each disease using genome-wide association study (GWAS). A diversity panel of 196 spring wheat genotypes was evaluated for their reaction to stripe rust at eight environments, leaf rust at four environments, leaf spot at three environments, common bunt at two environments, and grain yield at five environments.