Method for analyzing HR-TEM micrographs to propose and/or describe structures and their interaction in crystalline materials.

A general and versatile method for the analysis and processing of HR-TEM data useful for several applications is presented. The first utility is to identify the structures seen in the micrographs; also can be extended to propose the interaction of structure dynamics between various phases; and also it can be hybridized with the chemical method to make a proposal of new structure and/or phase. The general method consisted of four steps: 1) micrograph pretreatment, 2) measurement of planar distances, 3) structure identification, and 4) structure corroboration.