Wafer-Scale Photolithography-Pixeled Pb-Free Perovskite X-ray Detectors.

Pb-free perovskite material is considered to be a promising material utilized in next-generation X-ray detectors due to its high X-ray absorption coefficient, decent carrier transport properties, and relatively low toxicity. However, the pixelation of the perovskite material with an industry-level photolithography processing method remains challenging due to its poor structural stability. Herein, we use CsAgBiBr perovskite material as the prototype and investigate its interaction with photolithographic polar solvents.