CBED and LACBED: characterization of antiphase boundaries.

Convergent-beam electron diffraction (CBED) and large-angle convergent-beam electron diffraction (LACBED) techniques are well adapted to the characterization of several types of crystal defects. In fact, dislocations, grain boundaries and stacking faults have already been successfully characterized with these methods. In the present paper, we describe the CBED and LACBED characterization of another type of crystal defect showing a special interest in materials science: antiphase boundaries (APBs).