In numerous applications from radio to optical frequencies including stealth and energy harvesting, there is a need to design electrically thin layers capable of perfectly absorbing electromagnetic waves over a wide bandwidth. However, a theoretical upper bound exists on the bandwidth-to-thickness ratio of metal-backed, passive, linear, and time-invariant absorbing layers. Absorbers developed to date, irrespective of their operational frequency range or material thickness, significantly underperform when compared to this upper bound, failing to exploit the full potential that passive, linear, and time-invariant systems can provide.
View Article and Find Full Text PDFDue to the wave nature of light, the resolution achieved in conventional imaging systems is limited to around half of the wavelength. The reason behind this limitation, called diffraction limit, is that part of the information of the object carried by the evanescent waves scattered from an abject. Although retrieving information from propagating waves is not difficult in the far-field region, it is very challenging in the case of evanescent waves, which decay exponentially as travel and lose their power in the far-field region.
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