Publications by authors named "Pierre Taunier"

Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.

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