Length-scale-dependent stress relief mechanisms in indium at high homologous temperatures.

Nanoindentation and electron microscopy have been used to examine the length-scale-dependent stress relaxation mechanisms in well-annealed, high-purity indium at a homologous temperature of 0.69. The experimental methods, analysis, and observations serve as a stepping stone in identifying the stress relaxation mechanisms enabling the formation and growth of metallic dendrites originating at the buried interface between a metallic anode and a solid electrolyte separator.