Lattice Multislice Algorithm for Fast Simulation of Scanning Transmission Electron Microscopy Images.

We introduce a new approach to the numerical simulation of Scanning Transmission Electron Microscopy images. The Lattice Multislice Algorithm takes advantage of the fact that the electron waves passing through the specimen have limited bandwidth and therefore can be approximated very well by a low-dimensional linear space spanned by translations of a well-localized function. Just like in the PRISM algorithm recently published by C.

Optimized imaging using non-rigid registration.

The extraordinary improvements of modern imaging devices offer access to data with unprecedented information content. However, widely used image processing methodologies fall far short of exploiting the full breadth of information offered by numerous types of scanning probe, optical, and electron microscopies. In many applications, it is necessary to keep measurement intensities below a desired threshold.