Ultra-sensitive solution-processed broadband photodetectors based on vertical field-effect transistor.

In the past few decades, great attention has been paid to the development of IV-VI semiconductor colloidal quantum dots, such as PbSe, PbS and PbSSe, in infrared (IR) photodetectors due to their high photosensitivity, solution-processing and low cost fabrication. IR photodetectors based on field-effect transistors (FETs) showed high detectivity since the transconductance can magnify the drain-source current under certain applied gate voltages. However, traditional lateral FETs usually suffer from low photosensitivity and slow responsivity, which restricts their widespread commercial applications.

High-performance solution-processed colloidal quantum dots-based tandem broadband photodetectors with dielectric interlayer.

Recently, great attention has been paid to IV-VI colloidal quantum dots (CQDs) for their high photosensitivity, solution processability and low cost. Also, metal halide perovskites are very promising materials to realize the high-performance solution-processed visible-light photodetectors due to their cost-effective manufacturing, tunable absorption and photoluminescence in whole visible spectrum. In this paper, we present solution-processed CQDs-based tandem broadband photodetectors with low dark-current and high-sensitivity by inserting dielectric Polymethyl methacrylate (PMMA) interlayer between two sub-detectors.