Publications by authors named "Peng-cheng Hang"

In the present paper, apparatus and theory of surface analysis is introduced, and the progress in the application of laser ablation ICP-MS to microanalysis in ferrous, nonferrous and semiconductor field is reviewed in detail. Compared with traditional surface analytical tools, such as SEM/EDS (scanning electron microscopy/energy dispersive spectrum), EPMA (electron probe microanalysis analysis), AES (auger energy spectrum), etc. the advantage is little or no sample preparation, adjustable spatial resolution according to analytical demand, multi-element analysis and high sensitivity.

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In the present paper, under optimum experimental condition, two middle-low alloy slab and homogeneous samples were analyzed under the condition of spatial resolution about 100 microm by scanning mode. Element 2D intensity distribution can be converted into 2D concentration distribution via establishing calibration curve. The results showed that there is a central segregation for C, Si, Mn, P, S and Cu for 86 # slab sample, and C, Si, P and Ti for 174 # slab sample, the width of segregation band was estimated, and it agrees well with metallographic analysis.

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