Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction.

The spatial resolution of transmission Kikuchi diffraction (TKD) depends on experimental parameters such as atomic number, accelerating voltage, sample backtilt and thickness. In this work, the dependence of spatial resolution on these parameters is explored by using bilayered coarse-grained/nanocrystalline samples to determine the depth resolution. Digital image correlation of the Kikuchi patterns across grain boundaries is used to measure the lateral resolution.

Quaternion-based disorientation coloring of orientation maps.

The authors of the present work propose a color coding technique using quaternions for the display of crystallographic orientation data such as EBSD maps. The main difference to existing color coding techniques in this field is that it creates a color space, within which the perceived color differences are approximately proportional to Euclidean distances in the corresponding 3D quaternion vector space, and thus approximately proportional to mutual disorientation angles. Since all disorientation parameters (axis and angle pairs, but represented as quaternions) are taken into account, color ambiguities appearing in maps created by other techniques are successfully avoided, and the sub-grain orientation differences within grains can be unambiguously visualized.

Insights into the Silver Reflection Layer of a Vertical LED for Light Emission Optimization.

In this work, Ag as a highly reflective mirror layer of gallium nitride (GaN)-based blue vertical light-emitting diodes (VLEDs) has been systematically investigated by correlating scanning electron microscopy/energy dispersive X-ray spectroscopy/transmission Kikuchi diffraction/electron backscatter diffraction, aberration-corrected scanning transmission electron microscopy, and atomic force microscopy techniques. In the context of high-efficiency lighting, three critical aspects have been scrutinized on the nanoscale: (1) chemical diffusion, (2) grain morphology, and (3) surface topography of the Ag layer. We found that nanoscale inhomogeneous distribution of In in InGaN/GaN quantum wells (QWs), interfacial diffusion (In/Ga out-diffusion into the Ag layer and diffusion of Ag into p-GaN and QWs), and Ag agglomeration deteriorate the light reflectivity, which account for the decreased luminous efficiency in VLEDs.

Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data.

Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail.

Effect of triple junctions on deformation twinning in a nanostructured Cu-Zn alloy: A statistical study using transmission Kikuchi diffraction.

Scanning electron microscopy transmission Kikuchi diffraction is able to identify twins in nanocrystalline material, regardless of their crystallographic orientation. In this study, it was employed to characterize deformation twins in Cu/10 wt % Zn processed by high-pressure torsion. It was found that in 83% of grains containing twins, at least one twin intersects with a triple junction.

The first occurrence in the fossil record of an aquatic avian twig-nest with Phoenicopteriformes eggs: evolutionary implications.

Background: We describe the first occurrence in the fossil record of an aquatic avian twig-nest with five eggs in situ (Early Miocene Tudela Formation, Ebro Basin, Spain). Extensive outcrops of this formation reveal autochthonous avian osteological and oological fossils that represent a single taxon identified as a basal phoenicopterid. Although the eggshell structure is definitively phoenicopterid, the characteristics of both the nest and the eggs are similar to those of modern grebes.

Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope.

In this study, the new technique of transmission Kikuchi diffraction (TKD) in the scanning electron microscope (SEM) has been applied for the first time to enable orientation mapping of bulk, nanostructured metals. The results show how the improved spatial resolution of SEM-TKD, compared to conventional EBSD, enables reliable mapping of truly nanostructured metals and alloys, with mean grain sizes in the 40-200 nm range. The spatial resolution of the technique is significantly below 10nm, and contrasting examples are shown from both dense (Ni) and lighter (Al-alloy) materials.