Publications by authors named "Pallas A Papin"

A new method for the determination of the crystallographic indices of planar fracture surfaces is described. The key innovation is the use of a focused ion beam instrument to extract two transmission electron microscopy (TEM) foils from the fracture surface. Selected area diffraction of these foils in the TEM allows the determination of the fracture plane from the cross product of two crystallographic line directions contained within the plane.

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