We present first experimental results showing that single dust particles on a dielectric surface are mobilized and lofted due to exposure to an electron beam or ultraviolet radiation. It is shown that secondary electrons and/or photoelectrons emitted from a substrate surface are recollected on the surfaces within microcavities between a dust particle and the substrate surface, resulting in large negative charges and subsequently causing mobilization of the dust particle due to Coulomb repulsion. Dust mobility tested against the electron beam energy is shown to follow the secondary electron yield curve of the substrate surface in both the experimental and modeling results.
View Article and Find Full Text PDFThe article presents the analysis of the scheme of grazing incidence spectrometer with the normal to the line of site registration of the spectrum. The scheme is intended for the usage of the micro channel plate assembly as a spectrum detector. The main feature is the displacement of the entrance slit from the Rowland circle.
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