Compact and accurate concept of laser wavemeters based on ellipsometry.

Common laser wavemeters are based on a scanning Michelson interferometer. Displacements of the moving mirror as long as tens of centimeters are needed to reach a relative accuracy of 1 × 10(-6) (1σ) on the unknown laser wavelengths. Such a long displacement range makes the system very sensitive to mechanical vibrations and to misalignments of the laser beams.

Note: Multiscale scanning probe microscopy.

Combining the nanoscopic and macroscopic worlds is a serious challenge common to numerous scientific fields, from physics to biology. In this paper, we demonstrate nanometric resolution over a millimeter range by means of atomic-force microscopy using metrological stage. Nanometric repeatability and millimeter range open up the possibility of probing components and materials combining multiscale properties i.

Enlarged atomic force microscopy scanning scope: novel sample-holder device with millimeter range.

We propose a homemade sample-holder unit used for nanopositionning in two dimensions with a millimeter traveling range. For each displacement axis, the system includes a long range traveling stage and a piezoelectric actuator for accurate positioning. Specific electronics is integrated according to metrological considerations, enhancing the repeatability performances.