High-resolution stress mapping of polycrystalline alumina compression using synchrotron X-ray diffraction.

The ability to achieve uniform stress in uniaxial compression tests of polycrystalline alumina is of significance for the calibration of piezospectroscopic coefficients as well as strength studies in ceramics. In this study high-energy X-rays were used to capture powder diffraction profiles over a half-section of a polycrystalline alumina parallelepiped sample under an increasing uniaxial compressive load. The data were converted to strain and results were used for stress mapping of the sample.

Spectral analysis of R-lines and vibronic sidebands in the emission spectrum of ruby using genetic algorithms.

The advancement in spectral analysis methods for the emission spectrum of ruby has been driven by the characterization of R-line peak shifts with stress in order to establish piezospectroscopic relationships. These relationships form the basis for the development of photo-stimulated luminescence spectroscopy (PSLS) as a nondestructive method to determine the integrity of the thermally grown oxide (TGO) layer on jet engine turbine blades. Besides the measurement technique, the accuracy of PSLS in stress measurements is influenced by the spectral analysis methodology, which is the focus of this paper.