Publications by authors named "P Fornasini"

Extended x-ray absorption fine structure (EXAFS) has been measured at theedge of Sn in SnTe in the temperature range from 5 to 480 K. EXAFS results are consistent with the presence of a local rhombohedral distortion in the full temperature range from 5 to 300 K, even well above the ferroelectric transition temperature, suggesting a partial order-disorder character of the transition. At and above 300 K, the anomalous behaviour of the third and fourth EXAFS cumulants reveals a modification of the anharmonicity of the effective pair potential, possibly connected with the softening of high frequency modes or to the presence of multiple phases.

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Extended x-ray absorption fine structure (EXAFS) at the Cd K edge and diffraction patterns have been measured on CdTe as a function of pressure from 100 kPa (1 bar) to 5 GPa using a cell with nano-polycrystalline diamond anvils and an x-ray focussing scanning spectrometer. Three phases-zincblende (ZB), mixed cinnabar-ZB and rocksalt (RS)-are well distinguished in different pressure intervals. The bond compressibility measured by EXAFS in the ZB phase is slightly smaller than the one measured by diffraction and decreases significantly faster when the pressure increases; the difference is attributed to the effect of relative vibrations perpendicular to the Cd-Te bond.

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Extended X-ray absorption fine structure (EXAFS) is a powerful probe of the distribution of nearest-neighbour distances around selected atomic species. We consider here the effect of vibrational disorder in crystals. The potential of EXAFS for the accurate evaluation of the coefficient of bond thermal expansion and its temperature dependence is discussed, with the aim of stimulating and facilitating the comparison with the results from total scattering experiments.

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The effects of structural and vibrational disorder on the EXAFS signals are parameterized in terms of the Debye Waller (DW) factor. Here the vibrational contribution is addressed, which for most systems can be singled out by studying the temperature dependence of the EXAFS DW factor, which corresponds to a good accuracy to the parallel mean square relative displacement (MSRD) around the inter-atomic equilibrium distance. By comparing the first-shell EXAFS thermal expansion with the crystallographic thermal expansion one can evaluate the perpendicular MSRD.

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The bond thermal expansion is in principle different from the lattice expansion and can be measured by correlation sensitive probes such as extended x-ray absorption fine structure (EXAFS) and diffuse scattering. The temperature dependence of the coefficient α(bond)(T) of bond thermal expansion has been obtained from EXAFS for CdTe and for Cu. A coefficient α(tens)(T) of negative expansion due to tension effects has been calculated from the comparison of bond and lattice expansions.

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