Statistical methods for linking material composition to recombination losses in optoelectronic devices.

In light of the accumulation of characterization measurement data in the industrial production of solar cell devices, the investigation of a large amount of samples by statistical means lends itself to be a useful tool to gain further insights into how the data correlate with performance parameters. However, due to the multicollinearity among high-dimensional input parameters of compositional data, revealing the underlying patterns may prove to be a difficult endeavor. In this work, we present statistics consisting of 280 thin-film solar cell samples based on Cu(In, Ga)(S, Se)2 absorber layers whose depth-resolved composition was assessed by glow-discharge optical emission spectroscopy (GDOES).

32 bin near-infrared time-multiplexing detector with attojoule single-shot energy resolution.

We present two implementations of photon counting time-multiplexing detectors for near-infrared wavelengths, based on Peltier cooled InGaAs/InP avalanche photodiodes. A first implementation is motivated by practical considerations using only commercially available components. It features 16 bins, pulse repetition rates of up to 22 kHz, and a large range of applicable pulse widths of up to 100 ns.

SiPM for fast Photon-Counting and Multiphoton Detection.

We demonstrate fast counting and multiphoton detection abilities of a Silicon Photo Multiplier (SiPM). In fast counting mode we are able to detect two consecutive photons separated by only 2.3 ns corresponding to 430 MHz.