Angular reflectance model for ridged specular surfaces, with comprehensive calculation of inter-reflections and polarization.

The color of a surface structured at the mesoscopic scale differs from the one of a flat surface of the same material because of the light inter-reflections taking place in the concavities of the surface, as well as shadowing effects. The color variation arises not only in scattering materials, but also in the absence of scattering, e.g.

Electromagnetic analysis for optical coherence tomography based through silicon vias metrology.

This paper reports on progress in the analysis of time-domain optical coherence tomography (OCT) applied to the dimensional metrology of through-silicon vias (TSVs), which are vertical interconnect accesses in silicon, enabling three-dimensional (3D) integration in microelectronics, and estimates the deviations from earlier, simpler models. The considered TSV structures are 1D trenches and circular holes etched into silicon with a large aspect ratio. As a prerequisite for a realistic modeling, we work with spectra obtained from reference interferograms measured at a planar substrate, which fully includes the dispersion of the OCT apparatus.

Numerical modeling of nominal and stray waves in birefringent interferometers: application to large-field-of-view imaging Fourier transform spectrometers.

Birefringent interferometers are often used for compact static Fourier transform spectrometers. In such devices, several uniaxial birefringent parallel or prismatic plates are stacked, with their optical axes set so that there is an efficient coupling from ordinary to extraordinary and extraordinary to ordinary eigenmodes of two successive plates. Such coupling, aside from few particular cases, is, however, not perfect, an effect that may adversely affect performance.

Reduction of material mass of optical component in cryogenic camera by using high-order Fresnel lens on a thin germanium substrate.

We designed a compact infrared cryogenic camera using only one lens mounted inside the detector area. In the field of cooled infrared imaging systems, the maximal detector area is determined by the dewar. It is generally a sealed and cooled environment dedicated to the infrared quantum detector.