Tunable deep ultraviolet laser based near ambient pressure photoemission electron microscope for surface imaging in the millibar regime.

A newly developed instrument comprising a near ambient pressure (NAP) photoemission electron microscope (PEEM) and a tunable deep ultraviolet (DUV) laser source is described. This NAP-PEEM instrument enables dynamic imaging of solid surfaces in gases at pressures up to 1 mbar. A diode laser (976 nm) can illuminate a sample from the backside for in situ heating in gases up to 1200 K in minutes.

A near ambient pressure photoemission electron microscope (NAP-PEEM).

Photoemission electron microscopy (PEEM) is a powerful surface technique for dynamic imaging of surface processes while PEEM studies have been performed under ultrahigh vacuum or high vacuum conditions. Here we report on a near ambient pressure PEEM (NAP-PEEM) instrument, which enables high resolution PEEM imaging in near ambient pressure (> 1 mbar) gases over a wide temperature range (150 - 1200 K). Installed with an electron gun near ambient pressure low energy electron microscopy (NAP-LEEM) can be achieved as well.

Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources.

We describe the design and commissioning of a novel aberration-corrected low energy electron microscope (AC-LEEM). A third magnetic prism array (MPA) is added to the standard AC-LEEM with two prism arrays, allowing the incorporation of an ultrafast spin-polarized electron source alongside the standard cold field emission electron source, without degrading spatial resolution. The high degree of symmetries of the AC-LEEM are utilized while we design the electron optics of the ultrafast spin-polarized electron source, so as to minimize the deleterious effect of time broadening, while maintaining full control of electron spin.

eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument.

We are developing a transmission electron microscope that operates at extremely low electron energies, 0-40 eV. We call this technique eV-TEM. Its feasibility is based on the fact that at very low electron energies the number of energy loss pathways decreases.

The new ambient-pressure X-ray photoelectron spectroscopy instrument at MAX-lab.

The new instrument for near-ambient-pressure X-ray photoelectron spectroscopy which has been installed at the MAX II ring of the Swedish synchrotron radiation facility MAX IV Laboratory in Lund is presented. The new instrument, which is based on a SPECS PHOIBOS 150 NAP analyser, is the first to feature the use of retractable and exchangeable high-pressure cells. This implies that clean vacuum conditions are retained in the instrument's analysis chamber and that it is possible to swiftly change between near-ambient and ultrahigh-vacuum conditions.