Publications by authors named "Oliver R Hoidn"

There are several reports in the scientific literature of the use of mass-produced charge coupled device or complementary metal oxide semiconductor (CMOS) sensors as x-ray detectors that combine high spatial resolution with significant energy resolution. Exploiting a relatively new especially favorable ambient-temperature back-illuminated CMOS sensor, we report the development of a spectroscopic x-ray camera having particularly impressive performance for 2-6 keV photons. This instrument has several beneficial characteristics for advanced x-ray spectroscopy studies in the laboratory, at synchrotron light sources, at x-ray free electron lasers, or when using pulsed x-ray sources such as for laser plasma physics research.

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Article Synopsis
  • X-ray emission spectroscopy is becoming a crucial method for analyzing electronic structures, complementing x-ray absorption techniques by focusing on electronic states near specific elements like sulfur and phosphorus.
  • A compact spectrometer using a dispersive refocusing Rowland circle design provides high energy resolution in the 2-2.5 keV range, allowing effective use of low-powered x-ray sources while achieving count rates similar to those of advanced synchrotron facilities.
  • The portable design of this spectrometer, with a 10-cm diameter Rowland circle and a small x-ray camera, offers high instrumental efficiency and potential for enhanced efficiency through future multiplexing or use in controlled environments.
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We have integrated mass-produced commercial complementary metal-oxide-semiconductor (CMOS) image sensors and off-the-shelf single-board computers into an x-ray camera platform optimized for acquisition of x-ray spectra and radiographs at energies of 2-6 keV. The CMOS sensor and single-board computer are complemented by custom mounting and interface hardware that can be easily acquired from rapid prototyping services. For single-pixel detection events, i.

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