Recent reports on machine learning and machine vision (MV) devices have demonstrated the potential of two-dimensional (2D) materials and devices. Yet, scalable 2D devices are being challenged by contact resistance and Fermi level pinning (FLP), power consumption, and low-cost CMOS compatible lithography processes. To enable CMOS + 2D, it is essential to find a proper lithography strategy that can fulfill these requirements.
View Article and Find Full Text PDFRecent reports on thermal and thermoelectric properties of emerging 2D materials have shown promising results. Among these materials are Zirconium-based chalcogenides such as zirconium disulfide (ZrS ), zirconium diselenide (ZrSe ), zirconium trisulfide (ZrS ), and zirconium triselenide (ZrSe ). Here, the thermal properties of these materials are investigated using confocal Raman spectroscopy.
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