Automation of MKID Simulations for Array Building with AEM (Automated Electromagnetic MKID Simulations).

Microwave Kinetic Inductance Detectors (MKIDs) are photon detectors comprised of superconducting LC resonators with unique resonant frequencies corresponding to their geometrical structure. As each pixel has its own geometry, electromagnetic simulations by hand of every pixel in a kilo-pixel array are impractical. Simulating fewer pixels and interpolating in between risks reduced pixel yield in arrays due to overlapping resonant frequencies.

Optimizing Ti/TiN Multilayers for UV, Optical and Near-IR Microwave Kinetic Inductance Detectors.

Microwave Kinetic Inductance Detectors (MKIDs) combine significant advantages for photon detection like single photon counting, single pixel energy resolution, vanishing dark counts and µs time resolution with a simple design and the feasibility to scale up into the megapixel range. But high quality MKID fabrication remains challenging as established superconductors tend to either have intrinsic disadvantages, are challenging to deposit or require very low operating temperatures. As alternating stacks of thin Ti and TiN films have shown very impressive results for far-IR and sub-mm MKIDs, they promise significant improvements for UV, visible to near-IR MKIDs as well, especially as they are comparably easy to fabricate and control.