Physicochemical characterization and rheological properties of magnetic elastomers containing different shapes of corroded carbonyl iron particles.

Carbonyl iron particles (CIPs) is one of the key components in magnetic rubber, known as magnetorheological elastomer (MRE). Apart from the influence of their sizes and concentrations, the role of the particle' shape is pronounced worthy of the attention for the MRE performance. However, the usage of CIPs in MRE during long-term applications may lead to corrosion effects on the embedded CIPs, which significantly affects the performance of devices or systems utilizing MRE.

Electron microscopy determination of crystallographic polarity of aluminum nitride thin films.

Aluminum nitride (AlN) crystallizes usually in the wurtzite structure (P6mc) and it has a crystallographic polarity. In this work, the polarity in AlN was characterized by using several methods of transmission electron microscopy (TEM) in order to examine their applicability. AlN was deposited by metalorganic vapor phase epitaxy (MOVPE), followed by annealing at 1550 °C.

Green Synthesis of Magnetite (Fe3O4) Nanoparticles Using Seaweed (Kappaphycus alvarezii) Extract.

In this study, a simple, rapid, and eco-friendly green method was introduced to synthesize magnetite nanoparticles (Fe3O4-NPs) successfully. Seaweed Kappaphycus alvarezii (K. alvarezii) was employed as a green reducing and stabilizing agents.

Scanning electron microscope observation of dislocations in semiconductor and metal materials.

Scanning electron microscope (SEM) image contrasts have been investigated for dislocations in semiconductor and metal materials. It is revealed that single dislocations can be observed in a high contrast in SEM images formed by backscattered electrons (BSE) under the condition of a normal configuration of SEM. The BSE images of dislocations were compared with those of the transmission electron microscope and scanning transmission electron microscope (STEM) and the dependence of BSE image contrast on the tilting of specimen was examined to discuss the origin of image contrast.

Variations in contrast of scanning electron microscope images for microstructure analysis of Si-based semiconductor materials.

Image contrasts of Si-based semiconducting materials have been investigated by using the latest scanning electron microscope with various detectors under a range of experimental conditions. Under a very low accelerating voltage (500 V), we obtained a good image contrast between crystalline SiGe whiskers and the amorphous matrix using an in-lens secondary electron (SE) detector, while the conventional topographic SE image and the compositional backscattered electron (BSE) image gave no distinct contrast. By using an angular-selective BSE (AsB) detector for wide-angle scattered BSE, on the other hand, the crystal grains in amorphous matrix can be clearly visualized as 'channelling contrast'.

Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate.

The application of a focused ion beam (FIB) mill equipped with a microsampling unit to a tin-plated specimen was reported briefly. Tin-plating has a serious problem: Whiskers are liable to grow on the surface of tinplates. In order to clarify the mechanism of the whisker growth, detail characterisation is conducted using transmission electron microscopy (TEM).

Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient.

Metastable long-period superstructures in an L10-TiAl single crystal with a composition gradient were observed successfully by transmission electron microscopy with a focused ion beam (FIB) microsampling technique. The composition gradient from 54.7 to 75 at.

HRTEM image contrast and atomistic microstructures of long-period ordered Al-rich TiAl alloys.

Long-period superstructures formed in off-stoichiometric L 1(0)-TiAl alloys were investigated by high-resolution transmission electron microscopy (HRTEM). The HRTEM analysis combined with multislice simulation and image processing was carried out to clarify atomistic microstructures of Al5Ti3 and h-Al2Ti ordered states and a short-range ordered (SRO) state in Ti-62.5 at.