Ellipsometric Surface Plasmon Resonance (SPR) sensors are known for their relatively simple optical configuration compared to interferometric and optical heterodyne phase interrogation techniques. However, most of the previously explored ellipsometric SPR sensors based on intensity measurements are limited by their real-time applications because phase or polarization shifts are conducted serially. Here we present an ellipsometric SPR sensor based on a Kretschmann-Raether (KR) diverging beam configuration and a pixelated microgrid polarization camera.
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