A wavelet based algorithm for the identification of oscillatory event-related potential components.

Event related potentials (ERPs) are very feeble alterations in the ongoing electroencephalogram (EEG) and their detection is a challenging problem. Based on the unique time-based parameters derived from wavelet coefficients and the asymmetry property of wavelets a novel algorithm to separate ERP components in single-trial EEG data is described. Though illustrated as a specific application to N170 ERP detection, the algorithm is a generalized approach that can be easily adapted to isolate different kinds of ERP components.