Phase measurement techniques using a single-shot carrier fringe pattern play an important role in optical science and technology and have been widely used for various applications. In this paper, we focus on the comparative study of two major fringe analysis techniques, the sampling moiré (SM) and the windowed Fourier transform (WFT). While SM converts a single-fringe pattern to multiple phase-shifted moiré fringe patterns to extract the phase information in the spatial domain, WFT obtains the phase information in the windowed Fourier domain; thus, the two methods look entirely different.
View Article and Find Full Text PDFAccurately extracting phase or phase derivative is the most important requirement in optical metrology. However, in practice, there are many error sources, among which nonlinear distortion in fringe patterns is often encountered. Several techniques have been proposed over time to remove the nonlinearity error.
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