Reliability effects of lateral filament confinement by nano-scaling the oxide in memristive devices.

Write-variability and resistance instability are major reliability concerns impeding implementation of oxide-based memristive devices in neuromorphic systems. The root cause of the reliability issues is the stochastic nature of conductive filament formation and dissolution, whose impact is particularly critical in the high resistive state (HRS). Optimizing the filament stability requires mitigating diffusive processes within the oxide, but these are unaffected by conventional electrode scaling.

A Consistent Model for Short-Term Instability and Long-Term Retention in Filamentary Oxide-Based Memristive Devices.

Major challenges concerning the reliability of resistive switching random access memories based on the valence change mechanism (VCM) are short-term instability and long-term retention failure of the programmed resistance state, particularly in the high resistive state. On the one hand, read noise limits the reliability of VCMs via comparatively small current jumps especially when looking at the statistics of millions of cells that are needed for industrial applications. Additionally, shaping algorithms aiming for an enlargement of the read window are observed to have no lasting effect.