Anisotropic heat-conducting materials play crucial roles in designing electronic, optoelectronic, and thermoelectric devices, where temperature and thermal stress are important. Despite substantial research efforts, a major obstacle to determining the anisotropic thermal diffusivity tensor in polycrystalline systems is the need for a robust, direct, and nondestructive technique to distinguish between distinct thermal diffusivities. Here, we demonstrate a conceptually unique thermal diffusivity microscope capable of performing high-resolution local measurements of anisotropic thermal diffusivity.
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