Terahertz focal plane array imaging methods, direct camera imaging and conventional light field imaging methods are incapable of resolving and separating layers of multilayer objects. In this paper, for the purpose of fast, high-resolution and layer-resolving imaging of multilayer structures with different reflection characteristics, a novel angular intensity filtering (AIF) method based on terahertz light-field imaging is purposed. The method utilizes the extra dimensional information from the 4D light field and the reflection characteristics of the imaging object, and the method is capable to resolve and reconstruct layers individually.
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