A comparative assessment of cytotoxic activity and phytochemical profiling of J.L.Ellis and (Burm. f.) Nees using UPLC-QTOF-MS/MS approach.

(Burm. f.) Nees and J.

Cryptococcal Postinfectious Inflammatory Response Syndrome in an Immunocompetent Host.

Cryptococcal-postinfectious inflammatory response syndrome (c-PIIRS) in an immunocompetent host is a rare entity. Unlike cryptococcal-immune reconstitution inflammatory syndrome, in c-PIIRS, macrophage clearance defect can be persistent, and the patient requires prolonged immunosuppressants to control inflammation. Early identification and treatment can reduce the mortality and morbidity in cryptococcal meningitis (CM).

Factors Affecting the Effective Management of Acute Stroke: A Prospective Observational Study.

Background: Stroke, characterized by sudden loss of cerebral function, is among one of the leading cause of death and disability world over. The newer treatment modalities have changed the landscape of stroke treatment but are very much time bound.

Aim: To characterize pre-hospital and in-hospital factors affecting acute stroke management thus defining lacunae in stroke management.

Multilayer antireflection coatings for the visible and near-infrared regions.

With a high-refractive-index mixed-oxide dielectric material of ZrTiO(4) and ZrO(2) [Substance H2 (Sub2) from E. Merck, Darmstadt, Germany], in combination with magnesium flouride (MgF(2)), design optimization and experimental production of low-loss antireflection (AR) coatings are carried out. Design-optimization studies that make use of these materials as constituents of a seven-layer coating system demonstrate that when the useful bandwidth of an AR coating is extended to cover a wider spectral range, the designs are in general found to have increased integrated reflection loss, higher ripple, and increased spectral instability.

Effect of high-energy electron-beam irradiation on the optical properties of ion-beam-sputtered silicon oxynitride thin films.

Silicon oxynitride thin films are prepared by ion-beam sputtering, and the optical properties and surface chemical composition are studied by spectrophotometric and x-ray photoelectron spectroscopy, respectively. It is seen that the films sputtered by use of nitrogen alone as the sputtering species from a silicon nitride target are completely transparent (k < 0.005) and have a refractive-index dispersion from 1.

Low-reflection-loss attenuator optical coatings: theory and experiment.

Following the optical admittance matching approach, we have derived explicit equations to evaluate the refractive index and thickness of the matching dielectric layer deposited on an attenuator layer to obtain zero or near-zero reflection loss at one or more than one wavelength. With these equations a new family of optical coatings that can not only attenuate the input optical radiation to a required level but can also show a very low reflection loss (less than 0.1%) within a specified band is successfully designed and developed.

Optical properties of semiconductor-metal composite thin films in the infrared region.

Germanium:silver (Ge:Ag) composite thin films having different concentrations of Ag, ranging from 7% to 40%, have been prepared by dc cosputtering of Ge and Ag. The films' surface morphology and optical properties have been characterized using transmission electron microscopy and infrared spectrophotometry. It is seen that, although the films that contain lower concentrations of Ag have islandlike morphology (i.

Design of three-layer antireflection coatings: a generalized approach.

A generalized theoretical formulation for multilayer antireflection coatings (ARCs) has been established, which has scope for considering both zero and nonzero reflectance at one or more than one wavelength. Starting with this, a new design method for three-layer ARCs making use of input reflectance parameters at two wavelengths (R(1) and R(2) at lambda(1) and lambda(2)) has been developed. It allows for determination of all the unknown design parameters explicitly without any a priori conditions on them.

Determination of optical properties of absorbing materials: a generalized scheme.

A generalized reflectance method for determination of optical properties of absorbing materials is developed and compared with other reflectance methods. In the present scheme the specimen is coated with dielectric transparent layer(s) and the reflectance ratios are measured. This novel scheme of specimen preparation and the method of measurement allow the specimen to be free from surface layers and at the same time account for possible effects of surface roughness.

Optical constants of absorbing materials: a new approach.

A detailed study of a new method of determining the optical properties of absorbing materials is presented. It makes use of normal incidence reflectances from the specimen itself (R(s)) and from the specimen coated with a transparent film of two different thicknesses but of the same refractive index (R(1s) and R(2s)) in the form of R(1s)/R(s) and R(2s)/R(s)- It is seen that a simple goniometer can be easily adopted for measuring the reflectance ratios over a wide spectral range. The versatility of the method has been proved by the fact that it has been successfully adopted for specimens with surface structures varying from atomically smooth to rough surfaces.