Graphene exhibits exciting properties which make it an appealing candidate for use in electronic devices. Reliable processes for device fabrication are crucial prerequisites for this. We developed a large area of CVD synthesis and transfer of graphene films.
View Article and Find Full Text PDFThe element-specific electronic structure of the organic semiconductor aluminum tris-8-hydroxyquinoline (Alq(3)) has been studied using a combination of resonant x-ray emission spectroscopy, x-ray photoelectron spectroscopy, x-ray absorption spectroscopy, and density functional theory (DFT) calculations. Resonant and nonresonant x-ray emission spectroscopy were used to measure directly the carbon, nitrogen and oxygen 2p partial densities of states in Alq(3), and good agreement was found with the results of DFT calculations. Furthermore, resonant x-ray emission at the carbon K-edge is shown to be able to measure the partial density of states associated with individual C sites.
View Article and Find Full Text PDFIn a study to link the optical and structural properties of solid films of magnesium Phthalocyanine (MgPc), a range of synchrotron based spectroscopic methods have been used. These include X-ray excited optical luminescence (XEOL) together with X-ray absorption spectroscopy (XAS) measured both by total electron yield methods (TEY) and by using the optically detected photoluminescence yield method (PLY). XEOL spectra below K shell threshold show a broad emission peak at approximately 860 nm which can be attributed to the optical Q-band of these organic systems, which is then suppressed above the threshold.
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