Magnetic and structural changes in the near-surface epitaxial YLaFeO films after high-dose ion implantation.

The method of magnetic force microscopy was used to study the domain structure of various-thickness epitaxial YLaFeO iron-yttrium garnet films modified by high-dose implantation of N nitrogen ions. The results of multi-crystal x-ray diffractometry were analyzed, and a possible defect structure of garnets prior to and after implantation was identified. It was established that the reduction of magnetic losses observed after high-dose ion implantation is accompanied by the essential ordering of magnetic domains on the surface of implanted films.

A new method for polychromatic X-ray μLaue diffraction on a Cu pillar using an energy-dispersive pn-junction charge-coupled device.

μLaue diffraction with a polychromatic X-ray beam can be used to measure strain fields and crystal orientations of micro crystals. The hydrostatic strain tensor can be obtained once the energy profile of the reflections is measured. However, this remains a challenge both on the time scale and reproducibility of the beam position on the sample.