A grazing incidence interferometric measurement procedure is applied to test rough convex steep rotationally symmetric aspherics. The measurement of rough surfaces is possible; i.e.
View Article and Find Full Text PDFFar field calculations of beams, such as laser beams, are often applied in optical engineering. Current beam propagation methods fail in certain range parameters due to high storage requirements of the algorithms. This paper presents a new beam propagation method for far field calculations of distorted Gaussian beams in a homogeneous medium including optical elements, such as lenses.
View Article and Find Full Text PDFGrazing incidence interferometry has been applied to plane, cylindrical, acylindrical, and general rod-like surfaces using diffractive beam splitters. Here, in a first step towards measuring aspherics, we demonstrate that also rough convex steep rotationally symmetric spherics can be measured along one meridian in a single step using diffractive beam splitters and phase shifting techniques. The measurement of rough surfaces is possible, i.
View Article and Find Full Text PDFIn the past, grazing incidence interferometry has been applied for rough plane, cylindrical, acylindrical, and general rod-like surfaces using diffractive beam splitters. Here, we demonstrate that also rough convex steep rotational symmetric spherical or aspherical surfaces can be measured along one meridian in a single step using diffractive beam splitters and phase-shifting techniques. The extension to the whole surface can be attained by successive meridional measurements of the surface under test by azimuthal adjustments.
View Article and Find Full Text PDFThis publication presents a novel interferometric method for the simultaneous spatially resolved analysis of an object under test regarding the phase transmission function and the magnitude and orientation of dichroism. Analogous to the classical phase-shifting interferometry, the measurement strategy is based on the variation of phase and polarization in an interferometer. This procedure allows one to analyze simultaneously and spatially resolved the dichroic properties of the object and its impact on the phase of the incoming light in one measurement cycle.
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